Handheld White Light Interferometer for Measuring Defect Depth in Windows
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چکیده
NASA Tech Briefs, November 2010 yield this behavior. Previous work on mean-square error characterization for ML estimators has predominantly focused on additive Gaussian noise. This work demonstrates that the discrete nature of the Poisson noise process leads to a distinctly different error behavior. This work was done by Baris I. Erkmen and Bruce E. Moision of Caltech for NASA’s Jet Propulsion Laboratory. For more information, contact [email protected]. NPO-46857
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Handheld White Light Interferometer for Measuring Defect Depth in Windows
NASA Tech Briefs, November 2010 yield this behavior. Previous work on mean-square error characterization for ML estimators has predominantly focused on additive Gaussian noise. This work demonstrates that the discrete nature of the Poisson noise process leads to a distinctly different error behavior. This work was done by Baris I. Erkmen and Bruce E. Moision of Caltech for NASA’s Jet Propulsion...
متن کاملHandheld White Light Interferometer for Measuring Defect Depth in Windows
NASA Tech Briefs, November 2010 yield this behavior. Previous work on mean-square error characterization for ML estimators has predominantly focused on additive Gaussian noise. This work demonstrates that the discrete nature of the Poisson noise process leads to a distinctly different error behavior. This work was done by Baris I. Erkmen and Bruce E. Moision of Caltech for NASA’s Jet Propulsion...
متن کاملHandheld White Light Interferometer for Measuring Defect Depth in Windows
NASA Tech Briefs, November 2010 yield this behavior. Previous work on mean-square error characterization for ML estimators has predominantly focused on additive Gaussian noise. This work demonstrates that the discrete nature of the Poisson noise process leads to a distinctly different error behavior. This work was done by Baris I. Erkmen and Bruce E. Moision of Caltech for NASA’s Jet Propulsion...
متن کاملHandheld White Light Interferometer for Measuring Defect Depth in Windows
NASA Tech Briefs, November 2010 yield this behavior. Previous work on mean-square error characterization for ML estimators has predominantly focused on additive Gaussian noise. This work demonstrates that the discrete nature of the Poisson noise process leads to a distinctly different error behavior. This work was done by Baris I. Erkmen and Bruce E. Moision of Caltech for NASA’s Jet Propulsion...
متن کاملHandheld White Light Interferometer for Measuring Defect Depth in Windows
NASA Tech Briefs, November 2010 yield this behavior. Previous work on mean-square error characterization for ML estimators has predominantly focused on additive Gaussian noise. This work demonstrates that the discrete nature of the Poisson noise process leads to a distinctly different error behavior. This work was done by Baris I. Erkmen and Bruce E. Moision of Caltech for NASA’s Jet Propulsion...
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